{"id":5199,"date":"2024-03-25T15:00:47","date_gmt":"2024-03-25T06:00:47","guid":{"rendered":"http:\/\/www-dsc.naist.jp\/dsc_naist\/?p=5199"},"modified":"2024-04-25T18:14:35","modified_gmt":"2024-04-25T09:14:35","slug":"dsc-internal-talk-in-march2","status":"publish","type":"post","link":"http:\/\/www-dsc.naist.jp\/dsc_naist\/en\/dsc-internal-talk-in-march2\/","title":{"rendered":"DSC internal talk in March"},"content":{"rendered":"<p>Assoc. Prof. Zentaro Akase gave a lecture in March.<\/p>\n<p>The details are as follows.<\/p>\n<p>====================<\/p>\n<p>Assoc. Prof. Zentaro Akase (Metrology Informatics Laboratory)<\/p>\n<p>TITLE:\u00a0<\/p>\n<p>Transmission Electron Microscopy for Electromagnetic Field Measurement in Small Areas<\/p>\n<p>Abstract:<\/p>\n<p>Transmission electron microscopy can be used not only for microstructural observation, crystal structure analysis, and chemical state analysis of a specimen, but also for evaluation of electromagnetic field distribution inside and outside the specimen by detecting phase modulation or deflection of transmitted electrons. In this talk, I will introduce examples of analyses of &#8220;electron holography&#8221; and &#8220;Lorentz microscopy,&#8221; which are typical electromagnetic field measurement methods of transmission electron microscopy, and discuss future developments from the viewpoint of metrology informatics.<\/p>\n<p>&nbsp;<\/p>\n<div class=\"block-list-appender wp-block\" tabindex=\"-1\" contenteditable=\"false\" data-block=\"true\">\n<div class=\"block-editor-default-block-appender\" data-root-client-id=\"\">\n<p class=\"block-editor-default-block-appender__content\" tabindex=\"0\" role=\"button\" aria-label=\"\u30c7\u30d5\u30a9\u30eb\u30c8\u30d6\u30ed\u30c3\u30af\u3092\u8ffd\u52a0\">\u00a0<\/p>\n<\/div>\n<\/div>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>Assoc. Prof. Zentaro Akase gave a lecture in March. The details are as follows. ==================== Assoc. Prof. Zentaro Akase (Metrology Informatics Laboratory) TITLE:\u00a0 Transmission Electron Microscopy for Electromagnetic Field Measurement in Small Areas Abstract: Transmission electron microscopy can be used not only for microstructural observation, crystal structure analysis, and chemical state analysis of a specimen, [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"en_US","_original_post":"http:\/\/www-dsc.naist.jp\/dsc_naist\/?p=5196","_links_to":"","_links_to_target":""},"categories":[3],"tags":[],"event_taxonomy":[15],"acf":[],"_links":{"self":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/5199"}],"collection":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/comments?post=5199"}],"version-history":[{"count":6,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/5199\/revisions"}],"predecessor-version":[{"id":5205,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/5199\/revisions\/5205"}],"wp:attachment":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/media?parent=5199"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/categories?post=5199"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/tags?post=5199"},{"taxonomy":"event_taxonomy","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/event_taxonomy?post=5199"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}