{"id":6570,"date":"2026-04-16T15:00:11","date_gmt":"2026-04-16T06:00:11","guid":{"rendered":"http:\/\/www-dsc.naist.jp\/dsc_naist\/?p=6570"},"modified":"2026-03-31T16:03:23","modified_gmt":"2026-03-31T07:03:23","slug":"dsc-internal-talk-in-april2026","status":"publish","type":"post","link":"http:\/\/www-dsc.naist.jp\/dsc_naist\/dsc-internal-talk-in-april2026\/","title":{"rendered":"4\u6708\u5b66\u5185\u5171\u540c\u7814\u7a76\u4fc3\u9032\u30c8\u30fc\u30af"},"content":{"rendered":"<p><span style=\"font-family: georgia, palatino, serif;\"><span style=\"font-size: 12pt;\">4<\/span><\/span><span style=\"font-family: georgia, palatino, serif;\"><span style=\"font-size: 12pt;\">\u6708\u306e\u5b66\u5185\u5171\u540c\u7814\u7a76\u4fc3\u9032\u30c8\u30fc\u30af\u306f\u3001\u8d64\u702c\u5584\u592a\u90ce \u5148\u751f\u306b\u3054\u8b1b\u6f14\u3044\u305f\u3060\u304d\u307e\u3057\u305f\u3002<\/span><\/span><\/p>\n<p><span style=\"font-family: georgia, palatino, serif;\">\u30bf\u30a4\u30c8\u30eb\u3068\u6982\u8981\u306f\u4ee5\u4e0b\u306b\u306a\u308a\u307e\u3059\u3002<\/span><\/p>\n<p><span style=\"font-family: georgia, palatino, serif; font-size: 12pt;\">==================== <\/span><\/p>\n<p>\u8d64\u702c\u5584\u592a\u90ce \u7279\u4efb\u51c6\u6559\u6388\uff08\u8a08\u6e2c\u30a4\u30f3\u30d5\u30a9\u30de\u30c6\u30a3\u30af\u30b9\u7814\u7a76\u5ba4\uff09<\/p>\n<p>TITLE:<br \/>\nNon-Rigid Registration for Correlative Atom Probe Tomography (APT) and Electron Tomography (ET): Application to Experimental Data and Accuracy Evaluation <\/p>\n<p>ABSTRACT\uff1a<br \/>\n\u00a0The increasing three-dimensional complexity of semiconductor devices has made it essential to characterize the spatial distribution of trace impurity atoms. Atom Probe Tomography (APT) offers high detection sensitivity, but its data often suffer from image distortion, limiting accurate spatial analysis. In contrast, Electron Tomography (ET) can acquire data with minimal distortion, but lacks sufficient sensitivity to detect such impurities. In this study, we use ET to correct image distortion in APT, thereby combining the strengths of both techniques. Our goal is to obtain the spatial distribution of trace impurity atoms with high sensitivity and high spatial resolution.<br \/>\nWe develop a non-rigid registration method for aligning APT and ET datasets and apply it to experimentally acquired data, demonstrating its practical feasibility. Furthermore, we propose a methodology for quantitative accuracy evaluation using model specimens. These results represent an important step toward reliable multimodal nanoscale analysis. <\/p>\n<p>&nbsp;<\/p>\n<p>&nbsp;<\/p>\n<div class=\"block-list-appender wp-block\" tabindex=\"-1\" contenteditable=\"false\" data-block=\"true\">\n<div class=\"block-editor-default-block-appender\" data-root-client-id=\"\">\n<p class=\"block-editor-default-block-appender__content\" tabindex=\"0\" role=\"button\" aria-label=\"\u30c7\u30d5\u30a9\u30eb\u30c8\u30d6\u30ed\u30c3\u30af\u3092\u8ffd\u52a0\">\u00a0<\/p>\n<\/div>\n<\/div>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>4\u6708\u306e\u5b66\u5185\u5171\u540c\u7814\u7a76\u4fc3\u9032\u30c8\u30fc\u30af\u306f\u3001\u8d64\u702c\u5584\u592a\u90ce \u5148\u751f\u306b\u3054\u8b1b\u6f14\u3044\u305f\u3060\u304d\u307e\u3057\u305f\u3002 \u30bf\u30a4\u30c8\u30eb\u3068\u6982\u8981\u306f\u4ee5\u4e0b\u306b\u306a\u308a\u307e\u3059\u3002 ==================== \u8d64\u702c\u5584\u592a\u90ce \u7279\u4efb\u51c6\u6559\u6388\uff08\u8a08\u6e2c\u30a4\u30f3\u30d5\u30a9\u30de\u30c6\u30a3\u30af\u30b9\u7814\u7a76\u5ba4\uff09 TITLE:  [&hellip;]<\/p>\n","protected":false},"author":1,"featured_media":0,"comment_status":"closed","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_locale":"ja","_original_post":"http:\/\/www-dsc.naist.jp\/dsc_naist\/?p=6570","_links_to":"","_links_to_target":""},"categories":[3],"tags":[],"event_taxonomy":[15],"acf":[],"_links":{"self":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/6570"}],"collection":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/comments?post=6570"}],"version-history":[{"count":2,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/6570\/revisions"}],"predecessor-version":[{"id":6572,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/posts\/6570\/revisions\/6572"}],"wp:attachment":[{"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/media?parent=6570"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/categories?post=6570"},{"taxonomy":"post_tag","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/tags?post=6570"},{"taxonomy":"event_taxonomy","embeddable":true,"href":"http:\/\/www-dsc.naist.jp\/dsc_naist\/wp-json\/wp\/v2\/event_taxonomy?post=6570"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}